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  • Ahlers, F.J., et al. (author)
  • The EMRP project GraphOhm- Towards quantum resistance metrology based on graphene
  • 2014
  • In: CPEM Digest (Conference on Precision Electromagnetic Measurements). - 0589-1485. - 9781479952052 ; , s. 548-549, s. 548-549
  • Conference paper (peer-reviewed)abstract
    • A new joint research project (JRP) integrating metrology institutes and universities from nine countries is aimed at realization of a new generation of standards for quantum resistance metrology. The project exploits graphene's properties to simplify operation of standards without compromising the unprecedented precision delivered by semiconductor quantum Hall devices. Higher operating temperatures (above 4.2 K, and up to 8 K) and together with lower magnetic fields (below 5 T, and potentially down to 2 T) will lead to a significantly improved and cost-saving dissemination of intrinsically referenced resistance standards to all end-users relying on electrical measurements.
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Type of publication
conference paper (1)
Type of content
peer-reviewed (1)
Author/Editor
Kubatkin, Sergey, 19 ... (1)
Ahlers, F.J. (1)
Kučera, J.L. (1)
Poirier, W. (1)
Jeanneret, B. (1)
Satrapinski, A.F. (1)
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Tzalenchuk, A.Y. (1)
Vrabček, P. (1)
Bergsten, Tobias (1)
Hwang, C. (1)
Yakimova, R. (1)
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University
Chalmers University of Technology (1)
RISE (1)
Language
English (1)
Research subject (UKÄ/SCB)
Natural sciences (1)
Year

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