SwePub - search: WFRF:(Flys Olena 1971 )

Enumeration	Reference	Cover	Find
1.	Flys, Olena, 1971-, et al. (author) Characterization of surface topography of a newly developed metrological gloss scale 2015 In: Surface Topography: Metrology and Properties. - Bristol : Institute of Physics (IOP). - 2051-672X. ; 3:4 Journal article (peer-reviewed)abstract In the European Joint Research Project 'Multidimensional Reflectometry for Industry', a new gloss scale was developed with the aim to represent different levels of gloss, hue, roughness, and refractive indices. In this paper, the surfaces of six selected samples were thoroughly investigated using various measuring techniques in order to verify the outcome of the novel manufacturing processes in terms of distinct levels as well as types of surface roughness. The aim of the evaluation was to capture surface structures in different wavelength intervals utilizing a confocal microscope, a coherence scanning interferometer, and an atomic force microscope. Power spectral density functions were also calculated from the measurements and used to determine suitability of techniques for different roughness scales. The measurements show that the expected surface characteristics as well as different RMS roughness values are intimately connected to the perceived glossiness.

Flys, Olena, 1971-, et al. (author)
Characterization of surface topography of a newly developed metrological gloss scale
2015
In: Surface Topography: Metrology and Properties. - Bristol : Institute of Physics (IOP). - 2051-672X. ; 3:4
Journal article (peer-reviewed)abstract
- In the European Joint Research Project 'Multidimensional Reflectometry for Industry', a new gloss scale was developed with the aim to represent different levels of gloss, hue, roughness, and refractive indices. In this paper, the surfaces of six selected samples were thoroughly investigated using various measuring techniques in order to verify the outcome of the novel manufacturing processes in terms of distinct levels as well as types of surface roughness. The aim of the evaluation was to capture surface structures in different wavelength intervals utilizing a confocal microscope, a coherence scanning interferometer, and an atomic force microscope. Power spectral density functions were also calculated from the measurements and used to determine suitability of techniques for different roughness scales. The measurements show that the expected surface characteristics as well as different RMS roughness values are intimately connected to the perceived glossiness.

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