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  • Jeppson, Kjell, 1947, et al. (author)
  • Hotspot test structures for evaluating carbon nanotube microfin coolers and graphene-like heat spreaders
  • 2016
  • In: 29th IEEE International Conference on Microelectronic Test Structures (ICMTS), Yokohama, Japan, Mar 28-31, 2016. - 1071-9032. ; , s. 32-36
  • Conference paper (peer-reviewed)abstract
    • The design, fabrication, and use of a hotspot-producing and temperature-sensing test structure for evaluating the thermal properties of carbon nanotubes, graphene and boron nitride for cooling of electronic devices in applications like 3D integrated chip-stacks, power amplifiers and light-emitting diodes is described. The test structure is a simple meander-shaped metal resistor serving both as the hotspot and the temperature thermo-meter. By use of this test structure, the influence of emerging materials like those mentioned above on the temperature of the hotspot has been evaluated with good accuracy).
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  • Result 1-1 of 1
Type of publication
conference paper (1)
Type of content
peer-reviewed (1)
Author/Editor
Liu, Johan, 1960 (1)
Huang, S. (1)
Jeppson, Kjell, 1947 (1)
Bao, Jie (1)
Sun, Shuangxi, 1986 (1)
Fu, Yifeng, 1984 (1)
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Zhang, Yong, 1982 (1)
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University
Chalmers University of Technology (1)
Language
English (1)
Research subject (UKÄ/SCB)
Engineering and Technology (1)
Year
2016 (1)

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