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  • Bordag, Michael, et al. (author)
  • Shear stress measurements on InAs nanowires by AFM manipulation
  • 2007
  • In: Small. - Weinheim : Wiley-VCH Verlagsgesellschaft. - 1613-6810 .- 1613-6829. ; 3:8, s. 1398-1401
  • Journal article (peer-reviewed)abstract
    • On an upward curve? The curvature of an elastically deformed nanowire pinned to a flat surface contains information about the maximum static friction force, and hence the shear stress, between the nanowire and the surface. Here, InAs nanowires are bent in a controlled manner using the tip of an atomic force microscope (see image). The shear stress can be obtained from a simple analysis according to the standard theory of elasticity.
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Type of publication
journal article (1)
Type of content
peer-reviewed (1)
Author/Editor
Samuelson, Lars (1)
Pettersson, Håkan (1)
Montelius, Lars (1)
Fröberg, Linus (1)
Bordag, Michael (1)
Ribayrol, Aline (1)
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Conache, Gabriela (1)
Gray, Struan (1)
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University
Halmstad University (1)
Lund University (1)
Language
English (1)
Research subject (UKÄ/SCB)
Natural sciences (1)
Engineering and Technology (1)
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