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Search: WFRF:(GUTTORMSEN M) > (2000-2004)

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  • Ryzhikov, V. D., et al. (author)
  • Behavior of new ZnSe(Te,O) semiconductor scintillators under high doses of ionizing radiation
  • 2001
  • In: IEEE Transactions on Nuclear Science. - : Institute of Electrical and Electronics Engineers (IEEE). - 0018-9499 .- 1558-1578. ; 48:4, s. 1561-1564
  • Journal article (peer-reviewed)abstract
    • Changes in scintillation and optical properties of scintillators based on ZnSe(Te,O) crystals were studied under influence of ionizing radiations: gamma (similar to1.3 MeV, up to 500 Mrad), protons (similar to 18 MeV, fluence up to 10(16) per cm(-2)), electrons (0.54-2.26 MeV, up to 50 Mrad), and neutrons (source-thermal reactor channel, fluence up to 1016 per cm(2)). Light output of gamma-irradiated scintillator crystals ZnSe(Te,O) was shown to decrease by less than 10-12% under doses of 100 Mrad, with transparence in the visible range worse by only 10-12%. Effects of electron irradiation are similar. Under neutron irradiation of crystals, increase in their light output by 20-150% is observed, with nontrivial changes of optical characteristics in the visible and infrared (IR) spectral ranges. Proton irradiation caused the most sharp degradation of scintillation properties of ZnSe(Te,O) crystals, with selective absorption bands appearing in the ER (4-7 mum) region. Accounting for the role of recombination centers related to zinc vacancies and properties of interstitial zinc atoms, a model is considered of radiation-stimulated processes in ZnSe(Te,O) semiconductor scintillators.
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