1. |
- Dahlqvist, Martin, et al.
(author)
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Out-Of-Plane Ordered Laminate Borides and Their 2D Ti-Based Derivative from Chemical Exfoliation
- 2021
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In: Advanced Materials. - : Wiley-VCH Verlagsgesellschaft. - 0935-9648 .- 1521-4095. ; 33:38
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Journal article (peer-reviewed)abstract
- Exploratory theoretical predictions in uncharted structural and compositional space are integral to materials discoveries. Inspired by M5SiB2 (T2) phases, the finding of a family of laminated quaternary metal borides, M M-4 SiB2, with out-of-plane chemical order is reported here. 11 chemically ordered phases as well as 40 solid solutions, introducing four elements previously not observed in these borides are predicted. The predictions are experimentally verified for Ti4MoSiB2, establishing Ti as part of the T2 boride compositional space. Chemical exfoliation of Ti4MoSiB2 and select removal of Si and MoB2 sub-layers is validated by derivation of a 2D material, TiOxCly, of high yield and in the form of delaminated sheets. These sheets have an experimentally determined direct band gap of approximate to 4.1 eV, and display characteristics suitable for supercapacitor applications. The results take the concept of chemical exfoliation beyond currently available 2D materials, and expands the envelope of 3D and 2D candidates, and their applications.
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2. |
- Gogova, Daniela, et al.
(author)
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Epitaxial growth of β -Ga 2 O 3 by hot-wall MOCVD
- 2022
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In: AIP Advances. - : AIP Publishing. - 2158-3226. ; 12:5, s. 055022-055022
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Journal article (peer-reviewed)abstract
- The hot-wall metalorganic chemical vapor deposition (MOCVD) concept, previously shown to enable superior material quality and highperformance devices based on wide bandgap semiconductors, such as Ga(Al)N and SiC, has been applied to the epitaxial growth ofβ-Ga2O3. Epitaxial β-Ga2O3 layers at high growth rates (above 1 μm/h), at low reagent flows, and at reduced growth temperatures(740 ○C) are demonstrated. A high crystalline quality epitaxial material on a c-plane sapphire substrate is attained as corroborated by a combination of x-ray diffraction, high-resolution scanning transmission electron microscopy, and spectroscopic ellipsometry measurements. Thehot-wall MOCVD process is transferred to homoepitaxy, and single-crystalline homoepitaxial β-Ga2O3 layers are demonstrated with a 201 ¯rocking curve width of 118 arc sec, which is comparable to those of the edge-defined film-fed grown (201) ¯ β-Ga2O3 substrates, indicative ofsimilar dislocation densities for epilayers and substrates. Hence, hot-wall MOCVD is proposed as a prospective growth method to be furtherexplored for the fabrication of β-Ga2O3
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3. |
- Gustafsson, Anders, et al.
(author)
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Cathodoluminescence investigations of dark-line defects in platelet-based InGaN nano-LED structures
- 2024
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In: Nanotechnology. - : IOP Publishing Ltd. - 0957-4484 .- 1361-6528. ; 35:25
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Journal article (peer-reviewed)abstract
- We have investigated the optical properties of heterostructured InGaN platelets aiming at red emission, intended for use as nano-scaled light-emitting diodes. The focus is on the presence of non-radiative emission in the form of dark line defects. We have performed the study using hyperspectral cathodoluminescence imaging. The platelets were grown on a template consisting of InGaN pyramids, flattened by chemical mechanical polishing. These templates are defect free, whereas the dark line defects are introduced in the lower barrier and tend to propagate through all the subsequent layers, as revealed by the imaging of different layers in the structure. We conclude that the dark line defects are caused by stacking mismatch boundaries introduced by multiple seeding and step bunching at the edges of the as-polished, dome shaped templates. To avoid these defects, we suggest that the starting material must be flat rather than dome shaped.
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4. |
- Knight, Sean Robert, et al.
(author)
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Room temperature two-dimensional electron gas scattering time, effective mass, and mobility parameters in AlxGa1−xN/GaN heterostructures (0.07 ≤ x ≤ 0.42)
- 2023
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In: Journal of Applied Physics. - : American Institute of Physics Inc.. - 0021-8979 .- 1089-7550. ; 134:18
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Journal article (peer-reviewed)abstract
- Al xGa 1−xN/GaN high-electron-mobility transistor (HEMT) structures are key components in electronic devices operating at gigahertz or higher frequencies. In order to optimize such HEMT structures, understanding their electronic response at high frequencies and room temperature is required. Here, we present a study of the room temperature free charge carrier properties of the two-dimensional electron gas (2DEG) in HEMT structures with varying Al content in the Al xGa 1−xN barrier layers between x=0.07 and x=0.42. We discuss and compare 2DEG sheet density, mobility, effective mass, sheet resistance, and scattering times, which are determined by theoretical calculations, contactless Hall effect, capacitance-voltage, Eddy current, and cavity-enhanced terahertz optical Hall effect (THz-OHE) measurements using a low-field permanent magnet (0.6 T). From our THz-OHE results, we observe that the measured mobility reduction from x=0.13 to x=0.42 is driven by the decrease in 2DEG scattering time, and not the change in effective mass. For x<0.42, the 2DEG effective mass is found to be larger than for electrons in bulk GaN, which in turn, contributes to a decrease in the principally achievable mobility. From our theoretical calculations, we find that values close to 0.3 m0 can be explained by the combined effects of conduction band nonparabolicity, polarons, and hybridization of the electron wavefunction through penetration into the barrier layer.
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5. |
- Li, Youbing, et al.
(author)
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A-site alloying-guided universal design of noble metal-based MAX phases
- 2024
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In: Matter. - : Cell Press. - 2590-2393 .- 2590-2385. ; 7:2, s. 523-538
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Journal article (peer-reviewed)abstract
- Mn+1AXn (MAX) phases have attracted significant attention due to their structural diversity and potential applications. Designing MAX phases with single-atom-thick A layers featuring 4d/5d-orbital electronic elements is interesting work. Here, we present a comprehensive report on noble metal-based M2(A1-xA′x)C (M = V, Ti, Nb; A = Al, Sn, In, Ga, Ge; A′ = Ru, Rh, Pd, Ir, Pt, Au and combinations thereof; 0 < x ≤ 0.4) phases featuring A sublayers of 4d/5d-orbital electronic elements through an A-site alloying strategy. The chemical composition of MAX phases can be adjusted by selecting different M- and A-site elements, with morphology tailored by distinct C sources. Furthermore, the V2(Sn0.8Pt0.2)C (15.7 wt % Pt) catalyst showed better performance for hydrogen evolution reaction compared to the commercial Pt/C (20 wt % Pt) electrode. This study highlights the prospects of A-site alloying for the design of novel MAX phases with unique properties and promising applications in electrocatalysis and beyond.
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6. |
- Li, Youbing, et al.
(author)
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Nanolaminated Ternary Transition Metal Carbide (MAX Phase)-Derived Core-Shell Structure Electrocatalysts for Hydrogen Evolution and Oxygen Evolution Reactions in Alkaline Electrolytes
- 2023
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In: The Journal of Physical Chemistry Letters. - : AMER CHEMICAL SOC. - 1948-7185. ; 14:2, s. 481-488
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Journal article (peer-reviewed)abstract
- The development of abundant, cheap, and highly active catalysts for the hydrogen evolution reaction (HER) and oxygen evolution reaction (OER) is important for hydrogen production. Nanolaminate ternary transition metal carbides (MAX phases) and their derived two-dimensional transition metal carbides (MXenes) have attracted considerable interest for electrocatalyst applications. Herein, four new MAX@MXene core-shell structures (Ta2CoC@ Ta2CTx, Ta2NiC@Ta2CTx, Nb2CoC@Nb2CTx, and Nb2NiC@Nb2CTx), in which the core region is Co/Ni-MAX phases while the edge region is MXenes, have been prepared. Under alkaline electrolyte conditions, the Ta2CoC@Ta2CTx core-shell structure showed an overpotential of 239 mV and excellent stability during the HER with MXenes as the active sites. For the OER, the Ta2CoC@Ta2CTx core- shell structure showed an overpotential of 373 mV and a small Tafel plot (56 mV dec-1), which maintained a bulk crystalline structure and generated Co-based oxyhydroxides that formed by surface reconstruction as active sites. Considering rich chemical compositions and structures of MAX phases, this work provides a new strategy for designing multifunctional electrocatalysts and also paves the way for further development of MAX phase-based materials for clean energy applications.
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7. |
- Papamichail, A., et al.
(author)
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Compositionally graded channel HEMTs towards improved linearity for low-noise RF amplifiers
- 2022
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In: 2022 Compound Semiconductor Week, CSW 2022.
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Conference paper (peer-reviewed)abstract
- Although AlGaN/GaN HEMTs with high power and current gain have been demonstrated in RF device applications, at high signal operation they show an inherent non-linear behavior which leads to gain compression and signal distortion. Polarization-doped AlGaN/GaN HEMTs, with a compositionally graded channel enables a linear response improvement through formation of a 3-D electron gas. In this work, we develop the growth process for graded channel HEMTs in a hot-wall MOCVD reactor. Control of the grading profile is established through growth parameter tuning. Afterwards, analysis by EDS allows for precise determination of Al composition across the channel. Conventional and graded channel HEMT structures were fabricated and characterized. Furthermore, the sheet resistance, carrier density and mobility in HEMT structures with different grading profiles are compared and discussed. The conventional (non-graded) structure revealed the highest electron mobility of ~2350 cm2/V.s, which is among the highest values reported.
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8. |
- Papamichail, Alexis, et al.
(author)
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Mg-doping and free-hole properties of hot-wall MOCVD GaN
- 2022
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In: Journal of Applied Physics. - : AIP Publishing. - 0021-8979 .- 1089-7550. ; 131:18
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Journal article (peer-reviewed)abstract
- The hot-wall metal-organic chemical vapor deposition (MOCVD), previously shown to enable superior III-nitride material quality and high performance devices, has been explored for Mg doping of GaN. We have investigated the Mg incorporation in a wide doping range (2.45 × 10 18 cm-3 up to 1.10 × 10 20 cm-3) and demonstrate GaN:Mg with low background impurity concentrations under optimized growth conditions. Dopant and impurity levels are discussed in view of Ga supersaturation, which provides a unified concept to explain the complexity of growth conditions impact on Mg acceptor incorporation and compensation. The results are analyzed in relation to the extended defects, revealed by scanning transmission electron microscopy, x-ray diffraction, and surface morphology, and in correlation with the electrical properties obtained by Hall effect and capacitance-voltage (C-V) measurements. This allows to establish a comprehensive picture of GaN:Mg growth by hot-wall MOCVD providing guidance for growth parameters optimization depending on the targeted application. We show that substantially lower H concentration as compared to Mg acceptors can be achieved in GaN:Mg without any in situ or post-growth annealing resulting in p-type conductivity in as-grown material. State-of-the-art p-GaN layers with a low resistivity and a high free-hole density (0.77 ω cm and 8.4 × 10 17 cm - 3, respectively) are obtained after post-growth annealing demonstrating the viability of hot-wall MOCVD for growth of power electronic device structures.
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9. |
- Persson, Axel, et al.
(author)
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Mg segregation at inclined facets of pyramidal inversion domains in GaN:Mg
- 2022
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In: Scientific Reports. - : Nature Portfolio. - 2045-2322. ; 12:1
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Journal article (peer-reviewed)abstract
- Structural defects in Mg-doped GaN were analyzed using high-resolution scanning transmission electron microscopy combined with electron energy loss spectroscopy. The defects, in the shape of inverted pyramids, appear at high concentrations of incorporated Mg, which also lead to a reduction in free-hole concentration in Mg doped GaN. Detailed analysis pinpoints the arrangement of atoms in and around the defects and verify the presence of a well-defined layer of Mg at all facets, including the inclined facets. Our observations have resulted in a model of the pyramid-shaped defect, including structural displacements and compositional replacements, which is verified by image simulations. Finally, the total concentration of Mg atoms bound to these defects were evaluated, enabling a correlation between inactive and defect-bound dopants.
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10. |
- Wang, Ji, et al.
(author)
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Structural stability under Xe-ion irradiation of TiZrNbTaV-based high-entropy alloy and nitride films
- 2023
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In: Surface & Coatings Technology. - : ELSEVIER SCIENCE SA. - 0257-8972 .- 1879-3347. ; 454
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Journal article (peer-reviewed)abstract
- Refractory high-entropy protective coatings are of interest for nuclear fuel cladding applications due to their corrosion resistant properties and irradiation resistance at elevated temperature. Here, TiZrNbTaV metallic and (TiZrNbTaV)N films were deposited by magnetron co-sputtering. The metal elemental contents of both films were nearly equiatomic. These films were irradiated by Xe ions at room temperature and 500 degrees C, and examined by X-ray diffraction and transmission electron microscopy. The as-deposited (TiZrNbTaV)N film showed a single NaCl-type fcc phase and a pronounced columnar growth structure, which could remain intact after irradiation treatments. In contrast, the as-deposited TiZrNbTaV film exhibited an amorphous structure and formed a bcc phase structure after irradiation at 500 degrees C. The TiZrNbTaV film after irradiation at 500 degrees C composed of depth -dependent size of grains. This distribution of grain size is consistent with simulated displacement damage. The stable structure of (TiZrNbTaV)N film under high temperature irradiation indicates that these materials have potential for use as protective coatings for nuclear fuel claddings.
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