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Träfflista för sökning "WFRF:(Thölén Anders 1938) ;srt2:(2000-2004)"

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1.	Thölén, Anders, 1938, et al. (author) Retrieving diffraction information from bright and dark field images of MgO 2001 In: Final Programme and Proceedings, SCANDEM 2001, June 12-15, Stockholm, 2001. ; , s. 202-203 Conference paper (peer-reviewed)
2.	Yao, Yiming, 1957, et al. (author) Characterization of contacting boundaries between small particles with microdiffraction 2002 In: Nanotechnology. ; 13:2, s. 169-174 Journal article (other academic/artistic)abstract Microdiffraction is used to characterize grain boundaries and misorientationbetween small particles. The incident beam and the trace direction of avertical contacting boundary can be determined from the diffraction spotsand the Kikuchi lines formed simultaneously by a small convergent probe ofthe electron beam. The bicrystal rotation can be obtained and thus theboundary structure of contacting particles can be estimated. The results forsmall particles of cobalt oxide showed that the accuracy of the method,which is mainly dominated by the determination of the trace and theverticality of the boundary, is comparable to that of the standardstereographic method, but the measurement and interpretation proceduresare greatly simplified. This method can be applied for various crystallinematerials including metals and alloys, ceramics, and semiconductorsprovided that the particle size is around 100 nm.
3.	Yao, Yiming, 1957, et al. (author) Thickness measurement of small particles in TEM with EELS, CBED and EFTEM 2002 In: Proceedings of ICEM-15 Durban 2002, 15th International Congress of Electron Microscopy, Durban South Africa, 1-6 September 2002. ; , s. 469-470 Conference paper (peer-reviewed)

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Type of publication: conference paper (2); journal article (1)

Type of content: peer-reviewed (2); other academic/artistic (1)

Author/Editor: Yao, Yiming, 1957 (3); Thölén, Anders, 1938 (3)

University: Chalmers University of Technology (3)

Language: English (3)

Research subject (UKÄ/SCB): Engineering and Technology (3); Natural sciences (1)

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