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Träfflista för sökning "WFRF:(Kittler H.) srt2:(2000-2004)"

Search: WFRF:(Kittler H.) > (2000-2004)

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1.
  • Henschel, W, et al. (author)
  • Electrical characterization of 12 nm EJ-MOSFETs on SOI substrates
  • 2004
  • In: Solid-State Electronics. - : Elsevier BV. - 0038-1101 .- 1879-2405. ; 48:5, s. 739-745
  • Journal article (peer-reviewed)abstract
    • A dual gate metal oxide semiconductor field effect transistor (MOSFET) with electrically variable shallow junctions (EJ-MOSFET) has been fabricated on silicon on insulator (SOI) substrates. This kind of transistor allows testing the limits of scalability at relaxed process requirements. Transistor gate lengths down to 12 run have been structured by electron beam lithography (EBL) and specific etching processes. The coupling of the upper gate to the inner transistor is carefully investigated.
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2.
  • Matas, J., et al. (author)
  • Comparison of face verification results on the XM2VTS database
  • 2000
  • In: Proceedings of the 15th International Conference on Pattern Recognition (ICPR'00) - Volume 4. - 0769507506 ; , s. 858-863
  • Conference paper (other academic/artistic)abstract
    • The paper presents results of the face verification contest that was organized in conjunction with International Conference on Pattern Recognition 2000 [14]. Participants had to use identical data sets from a large, publicly available multimodal database XM2VTSDB. Training and evaluation was carried out according to an a priori known protocol ([7]). Verification results of all tested algorithms have been collected and made public on the XM2VTSDB website [15], facilitating large scale experiments on classifier combination and fusion. Tested methods included, among others, representatives of the most common approaches to face verification - elastic graph matching, Fisher's linear discriminant and Support vector machines.
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