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X-ray and Neutron Reflectivity Principles and Applications / edited by Wolf Beiglböck, Jürgen Ehlers, Klaus Hepp, Hans A. Weidenmüller, Robert Beig, Wolfgang Domcke, Berthold-Georg Englert, Uriel Frisch, Peter Hänggi, Günther Hasinger, Wolfgang Hillebrandt, Robert L. Jaffe, Wolfhard Janke, H. von Löhneysen, Michelangelo Mangano, Jean-Michel Raimond, Didier Sornette, Stefan Theisen, Wolfram Weise, Johannes Zittartz, Francisco Guinea, Dieter Vollhardt, Jean Daillant, Alain Gibaud.

Beiglböck, Wolf. (author)
Beig, Robert. (author)
Daillant, Jean. (author)
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Domcke, Wolfgang. (author)
Ehlers, Jürgen. (author)
Englert, Berthold-Georg. (author)
Frisch, Uriel. (author)
Gibaud, Alain. (author)
Guinea, Francisco. (author)
Hänggi, Peter. (author)
Hasinger, Günther. (author)
Hepp, Klaus. (author)
Hillebrandt, Wolfgang. (author)
Jaffe, Robert L. (author)
Janke, Wolfhard. (author)
Löhneysen, H. von. (author)
Mangano, Michelangelo. (author)
Raimond, Jean-Michel. (author)
Sornette, Didier. (author)
Theisen, Stefan. (author)
Vollhardt, Dieter. (author)
Weidenmüller, Hans A. (author)
Weise, Wolfram. (author)
Zittartz, Johannes. (author)
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ISBN 9783540885887
Berlin, Heidelberg : Springer Berlin Heidelberg, 2009
English
Series: Lecture Notes in Physics, 0075-8450 ; 770
  • swepub:Mat__t
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Subject headings

Particles (Nuclear physics)  (LCSH)
Physics  (LCSH)
Surfaces (Physics)  (LCSH)
Physics 
Characterization and Evaluation of Materials 
Solid State Physics and Spectroscopy 
Surfaces and Interfaces, Thin Films 

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