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Semiconductor measurement technology Thermal resistance measurements / Frank F. Oettinger and David L. Blackburn.
- Oettinger, Frank F. (contributor)
- Blackburn, David L. (contributor)
- Washington, 1990
- English v, 72 s.
- Series: NIST special publication, 99-0824194-X ; 400:86
- swepub:Mat__t
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Subject headings
- Halvledare: elektroteknik
Publication and Content Type
- 621.315.592(021) (UDK)
- 53.08(021) (UDK)
- 537.622 028 7 (DDC)
- Uccd (kssb/8 (machine generated))
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