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Semiconductor measurement technology Version 2.0 of the TXYZ thermal analysis program: TXYZ20 /John Albers.
- BookEnglish1992
Publisher, publication year, extent ...
- Washington,1992
- 29 s.
Numbers
- LIBRIS-ID:99811
Supplementary language notes
- Language:English
Classification
- UDK:621.315.592(021)
- UDK:53.08(021)
- DDC:537.622 028 7
- Uccdkssb/8 (machine generated)
Series
- NIST special publication,99-0824194-X ;400:8940089
Subject headings and genre
Added entries (persons, corporate bodies, meetings, titles ...)
- Albers, John (contributor)
- Version 2.0 of the TXYZ thermal analysis program: TXYZ20
Related titles
- Part of/supplement to:Semiconductor measurement technologyWashington, 1974-National Bureau of Standards special publication ; 400:1-
fullvy:Serie_bilook_t
- NIST special publication,99-0824194-X ;400:8940089
Local library classifications, notes and subject headings
- L621.315.592(021)
- L53.08(021)
- LHalvledare: elektroteknik
- LMätteknik
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