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Semiconductor measurement technology Design and testing guides for the CMOS and lateral bipolar-on-SOI test library / Janet C. Marshall and Mona E. Zaghloul.
- Zaghloul, Mona E. (contributor)
- Marshall, Janet C. (contributor)
- Washington : U.S. Dept. of Commerce, 1994
- English vi, 132 s.
- Series: NIST special publication, 99-0824194-X ; 400:93
- swepub:Mat__t
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- Halvledare: elektroteknik
Publication and Content Type
- 621.315.592(021) (UDK)
- 53.08(021) (UDK)
- 537.622 028 7 (DDC)
- P (kssb)
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