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Digital Forensic Atomic Force Microscopy of Semiconductor Memory Arrays
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- Gray, Struan, 1965- (author)
- Högskolan i Halmstad,Centrum för forskning om inbyggda system (CERES)
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- Axelsson, Stefan, 1968- (author)
- Norwegian University of Science and Technology, Gjovik, Norway
- (creator_code:org_t)
- 2019-08-07
- 2019
- English.
- In: Advances in Digital Forensics XV. - Cham : Springer. - 9783030287528 - 9783030287511 ; , s. 219-237
- Conference paper (peer-reviewed)
Abstract
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- Atomic force microscopy is an analytical technique that provides very high spatial resolution with independent measurements of surface topography and electrical properties. This chapter assesses the potential for atomic force microscopy to read data stored as local charges in the cells of memory chips, with an emphasis on simple sample preparation (“delidding”) and imaging of the topsides of chip structures, thereby avoiding complex and destructive techniques such as backside etching and polishing. Atomic force microscopy measurements of a vintage EPROM chip demonstrate that imaging is possible even when sample cleanliness, stability and topographical roughness are decidedly sub-optimal. As feature sizes slip below the resolution limits of optical microscopy, atomic force microscopy offers a promising route for functional characterization of semiconductor memory structures in RAM chips, microprocessors and cryptographic hardware. © IFIP International Federation for Information Processing 2019. Published by Springer Nature Switzerland AG 2019
Subject headings
- NATURVETENSKAP -- Data- och informationsvetenskap -- Annan data- och informationsvetenskap (hsv//swe)
- NATURAL SCIENCES -- Computer and Information Sciences -- Other Computer and Information Science (hsv//eng)
Keyword
- Atomic force microscopy
- memory chip delidding
- surface imaging
Publication and Content Type
- ref (subject category)
- kon (subject category)
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