Surface roughness characterisation of a thin transparent dielectric-silver tandem by spectroscopic light scattering

• Spectroscopic light scattering was measured on a system of a dielectric layer on top of a thin (13 nm) silver film on a glass substrate. The analysis included both forward and backward scattering and excellent agreement between measured and modelled results was achieved. The theoretical analysis showed that the film interfaces were correlated, i.e. the substrate roughness was replicated, and that the interface roughness (root mean square) was in the nanometer range.

Subject headings

TEKNIK OCH TEKNOLOGIER  -- Elektroteknik och elektronik (hsv//swe)

ENGINEERING AND TECHNOLOGY  -- Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)

NATURVETENSKAP  -- Fysik (hsv//swe)

NATURAL SCIENCES  -- Physical Sciences (hsv//eng)

Keyword

roughness; dielectric-silver tandem; spectroscopic light scattering; MULTILAYER; FILMS

Publication and Content Type

ref (subject category)

art (subject category)