Dilution effect on the U-5f states : U in an Ag matrix

• The electronic structure of U-diluted in an Ag matrix has been studied in situ by ultraviolet and X-ray photoelectron spectroscopy (UPS and XPS, respectively). UxAg100-x thin films (x = 0-100 at.%) were produced by sputter co-deposition in an Ar atmosphere. UPS spectra of the Ag-4d line indicate formation of a homogeneous mixture despite the fact that U and Ag do not form stable alloys. A major goal of this work was to find out whether the dilution of U atoms in an inert matrix with no bonding states induces the localisation of the U-5f states. Both U-4f core level spectra and the U-5f spectra indicate U-5f delocalisation, down to 5 at.% of uranium in UxAg100-x films.

Subject headings

TEKNIK OCH TEKNOLOGIER  -- Materialteknik -- Metallurgi och metalliska material (hsv//swe)

ENGINEERING AND TECHNOLOGY  -- Materials Engineering -- Metallurgy and Metallic Materials (hsv//eng)

NATURVETENSKAP  -- Fysik -- Den kondenserade materiens fysik (hsv//swe)

NATURAL SCIENCES  -- Physical Sciences -- Condensed Matter Physics (hsv//eng)

Keyword

thin films

dc sputtering

electronic band structure

photoelectron

spectroscopies

electronic-structure

metal-clusters

noble-metal

photoelectron-spectroscopy

5f localization

d-bands

photoemission

silver

systems

transition

Publication and Content Type

ref (subject category)

art (subject category)