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Piezoelectric activ...
Piezoelectric activity in c-axis oriented LiNbO3/ZnO bilayers grown by laser ablation technique
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Sharma, P. (author)
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Sreenivas, K. (author)
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- Belova, Lyubov M. (author)
- KTH,Teknisk materialfysik
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- Rao, K. Venkat (author)
- KTH,Materialvetenskap
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(creator_code:org_t)
- Informa UK Limited, 2005
- 2005
- English.
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In: Ferroelectrics (Print). - : Informa UK Limited. - 0015-0193 .- 1563-5112. ; 329, s. 969-972
- Related links:
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https://urn.kb.se/re...
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https://doi.org/10.1...
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Abstract
Subject headings
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- LiNbO3/ZnO multi-layer with a preferred c-axis orientation has been grown on glass and SiO2/Si substrates by laser ablation technique. The piezoelectric activity in as deposited films is demonstrated using a novel approach to the atomic force microscope. In the presence of an in plane low frequency (0.1 to 5 Hz) ac electric field, we monitor and image the induced piezoelectric response normal to the film plane between two electrodes.
Subject headings
- TEKNIK OCH TEKNOLOGIER -- Materialteknik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Materials Engineering (hsv//eng)
Keyword
- piezoelectricity
- thin films
- laser ablation
- films
Publication and Content Type
- ref (subject category)
- art (subject category)
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