Search: onr:"swepub:oai:DiVA.org:kth-15524" >
Modeling and gradie...
Modeling and gradient pattern analysis of irregular SFM structures of porous silicon
-
Baroni, Mpma (author)
-
Rosa, R. R. (author)
-
da Silva, A. F. (author)
-
show more...
-
Pepe, I. (author)
-
Roman, L. S. (author)
-
Ramos, F. M. (author)
-
- Ahuja, Rajeev (author)
- KTH,Materialvetenskap
-
- Persson, Clas (author)
- KTH,Tillämpad materialfysik
-
Veje, E. (author)
-
show less...
-
(creator_code:org_t)
- Elsevier BV, 2006
- 2006
- English.
-
In: Microelectronics Journal. - : Elsevier BV. - 0026-2692. ; 37:4, s. 290-294
- Related links:
-
https://urn.kb.se/re...
-
show more...
-
https://doi.org/10.1...
-
show less...
Abstract
Subject headings
Close
- Technological applications in opto-electronic devices have increased the interest in characterizing porous silicon structure patterns. Due to its physical properties, solutions from KPZ 2D are adopted to simulate the structure of porous material interface whose spatial characteristics are equivalent to those found in porous silicon samples. The analysis of the simulated and real scanning Force Microscopy (SFM) surfaces was done using the Gradient Pattern Analysis (GPA). We found that the KPZ 2D model presented asymmetry levels compatible with the irregular surfaces observed by means of SFM images of pi-Si.
Keyword
- porous silicon
- KPZ equation
- gradient pattern analysis
- nanostructures
- asymmetric fragmentation patterns
- dynamics
Publication and Content Type
- ref (subject category)
- art (subject category)
Find in a library
To the university's database