onr:"swepub:oai:DiVA.org:kth-161313"
Search: onr:"swepub:oai:DiVA.org:kth-161313" > Deep defect centers...
- 1 of 1
- Previous record
- Next record
- To hitlist
Deep defect centers in silicon carbide monitored with deep level transient spectroscopy
- Dalibor, T (author)
- Pensl, G (author)
- Matsunami, H (author)
- show more...
- Kimoto, T (author)
- Choyke, W J (author)
- Schoner, A (author)
- Nordell, N (author)
- show less...
- 1997
- 1997
- English.
- In: Physica status solidi. A, Applied research. - 0031-8965 .- 1521-396X. ; 162:1, s. 199-225
- Journal article (peer-reviewed)
Subject headings
Close
Publication and Content Type
- ref (subject category)
- art (subject category)
Find in a library
- Physica status solidi. A, Applied research (Search for host publication in LIBRIS)
To the university's database
- 1 of 1
- Previous record
- Next record
- To hitlist
Find more in SwePub
- By the author/editor
- Dalibor, T
- Pensl, G
- Matsunami, H
- Kimoto, T
- Choyke, W J
- Schoner, A
- show more...
- Nordell, N
- show less...
- Articles in the publication
- Physica status s ...
- By the university
- Royal Institute of Technology
Search outside SwePub
- Extend your search to:
- Google Book Search
- Google Scholar
Kungliga biblioteket hanterar dina personuppgifter i enlighet med EU:s dataskyddsförordning (2018), GDPR. Läs mer om hur det funkar här.
Så här hanterar KB dina uppgifter vid användning av denna tjänst.
- Copyright © LIBRIS - National Library Systems
- LIBRIS.kb.se
