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Photoacoustic spectroscopy to determine the optical properties of thin film 4H-SiC

Astrath, N. G. C. (author)
Bento, A. C. (author)
Baesso, M. L. (author)
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da Silva, A. Ferreira (author)
Persson, Clas (author)
KTH,Tillämpad materialfysik
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 (creator_code:org_t)
Elsevier BV, 2006
2006
English.
In: Thin Solid Films. - : Elsevier BV. - 0040-6090 .- 1879-2731. ; 515:4, s. 2821-2823
  • Journal article (peer-reviewed)
Abstract Subject headings
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  • The optical transitions in a range of 1.5-5.2 eV of n-type 4H-SiC have been investigated experimentally by photoacoustic spectroscopy and theoretically by a full-potential linearized augmented plane wave method. From the absorption spectrum, we found the indirect optical bandgap at 3.2 eV and the direct transitions around 4.5 eV in very good agreement with what has been predicted by theoretical calculations.

Keyword

silicon carbide
photoacoustic spectroscopy
hexagonal sic polytypes
absorption-bands
4h
states
wave
cr

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ref (subject category)
art (subject category)

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