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Dynamic spin-polarized resonant tunneling in magnetic tunnel junctions

Miller, Casey W. (author)
Li, Zhi-Pan (author)
Schuller, Ivan K. (author)
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Dave, R. W. (author)
Slaughter, J. M. (author)
Åkerman, Johan (author)
KTH,Mikroelektronik och tillämpad fysik, MAP
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 (creator_code:org_t)
2007
2007
English.
In: Physical Review Letters. - 0031-9007 .- 1079-7114. ; 99:4
  • Journal article (peer-reviewed)
Abstract Subject headings
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  • Precisely engineered tunnel junctions exhibit a long sought effect that occurs when the energy of the electron is comparable to the potential energy of the tunneling barrier. The resistance of metal-insulator-metal tunnel junctions oscillates with an applied voltage when electrons that tunnel directly into the barrier's conduction band interfere upon reflection at the classical turning points: the insulator-metal interface and the dynamic point where the incident electron energy equals the potential barrier inside the insulator. A model of tunneling between free electron bands using the exact solution of the Schrodinger equation for a trapezoidal tunnel barrier qualitatively agrees with experiment.

Keyword

random-access memory
electron
magnetoresistance
criteria
gap

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ref (subject category)
art (subject category)

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