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Studies on ruthenium-doped InP growth by low-pressure hydride vapor-phase epitaxy

Soderstrom, D. (author)
Lourdudoss, Sebastian (author)
KTH,Mikroelektronik och informationsteknik, IMIT
Wallnas, M. (author)
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Dadgar, A. (author)
Stenzel, O. (author)
Bimberg, D. (author)
Schumann, H. (author)
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 (creator_code:org_t)
The Electrochemical Society, 2001
2001
English.
In: Journal of the Electrochemical Society. - : The Electrochemical Society. - 0013-4651 .- 1945-7111. ; 148:7, s. G375-G378
  • Journal article (peer-reviewed)
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  • Ruthenium-doped InP (InP:Ru) has been grown by low-pressure hydride vapor-phase epitaxy (LP-HVPE) using bis(eta (5)-2,4-dimethylpentadienyl)ruthenium(II) as precursor. Ruthenium concentrations in the range 2 x 10(15) to 2 x 10(18) cm(-3) have been achieved. The Ru incorporation has been studied in terms of incorporation flux, and it is shown that the growth rate limits: the incorporation rate. From current-voltage measurements on n-InP/InP:Ru/n-InP and p-InP/InP:Ru/p-InP structures, resistivities greater than 10(3) Omega cm and greater than 10(10) Omega cm have been obtained, respectively.

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