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Be-doped low-temperature-grown GaAs material for optoelectronic switches

Krotkus, A. (author)
Bertulis, K. (author)
Kaminska, M. (author)
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Korona, K. (author)
Wolos, A. (author)
Siegert, J. (author)
Marcinkevicius, Saulius (author)
KTH,Mikroelektronik och informationsteknik, IMIT
Roux, J. F. (author)
Coutaz, J. L. (author)
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 (creator_code:org_t)
Institution of Engineering and Technology (IET), 2002
2002
English.
In: IEE Proceedings - Optoelectronics. - : Institution of Engineering and Technology (IET). - 1350-2433 .- 1359-7078. ; 149:3, s. 111-115
  • Journal article (peer-reviewed)
Abstract Subject headings
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  • Structural, electrical and recombination properties of Be-doped low-temperature MBE grown (LTG) GaAs have been investigated by using a number of different experimental techniques. These properties were analysed with respect to the applications of LTG GaAs in ultrafast optoelectronic devices. It has been found that a moderate Be-doping improves the structural quality of the layers and does not affect their semi-insulating behaviour. Electron and hole capture cross-sections, critical parameters for the design of optoelectronic devices from LTG GaAs, equal to sigma(n) = 1.1 x 10(-13) and sigma(p) = 1.8 x 10(-15) cm(2) were also determined.

Keyword

epitaxial gaas
dynamics

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