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Electromagnetic pul...
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Thottappillil, Rajeev,1958-Uppsala University, Sweden
(author)
Electromagnetic pulse environment of cloud-to-ground lightning for EMC studies
- Article/chapterEnglish2002
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Institute of Electrical and Electronics Engineers (IEEE),2002
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LIBRIS-ID:oai:DiVA.org:kth-238775
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https://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-238775URI
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https://doi.org/10.1109/15.990727DOI
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Language:English
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Summary in:English
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Subject category:ref swepub-contenttype
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Subject category:art swepub-publicationtype
Notes
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The characteristics of lightning electromagnetic pulse (LEMP) from individual processes in lightning such as return strokes, preliminary breakdown pulses, pulses associated with the leader process, K-changes and M-changes, the isolated narrow bipolar pulses, and the pulse bursts have been known. However, there is a need for a combined characterization of the total LEMP environment created during the entire duration of lightning. An attempt is made to provide such a description that gives the distribution of the LEMP characteristics, which is important in its ability to interfere with electronic systems, such as peak amplitude, peak time derivative, pulse duration, number of pulses, and time interval between pulses, during the entire duration of a cloud-to-ground lightning. Separate electromagnetic environment characterizations for negative cloud-to-ground lightning and positive cloud-to-ground lightning are proposed, including all the significant LEMP sources. Based on the LEMP characterization, models for negative and positive cloud-to-ground lightning flashes, that could be used in electromagnetic compatibility (EMC) studies are proposed. The electromagnetic environment models for cloud-to-ground lightning can be coupled to the locations of lightning given by the lightning location system to give comprehensive information about the electromagnetic environment at a desired geographical location.
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Uppsala University, Sweden
(creator_code:org_t)
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In:IEEE transactions on electromagnetic compatibility (Print): Institute of Electrical and Electronics Engineers (IEEE)44:1, s. 203-2130018-93751558-187X
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