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Spectroscopic and Photographic Evaluation of the Near-Surface Layer Produced by Arc-Induced Polymer Ablation

Pettersson, Jonas (author)
KTH,Skolan för elektroteknik och datavetenskap (EECS)
Becerra Garcia, Marley, 1979- (author)
KTH,Elektroteknisk teori och konstruktion
Franke, Steffen (author)
Leibniz Inst Plasma Sci & Technol, D-17489 Greifswald, Germany.
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Gortschakow, Sergey (author)
Leibniz Inst Plasma Sci & Technol, D-17489 Greifswald, Germany.
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 (creator_code:org_t)
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2019
2019
English.
In: IEEE Transactions on Plasma Science. - : IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC. - 0093-3813 .- 1939-9375. ; 47:4, s. 1851-1858
  • Journal article (peer-reviewed)
Abstract Subject headings
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  • High-intensity plasmas can release material from the surface of polymers by a process known as arc-induced ablation. As consequence, the formation of a near-surface layer of polymeric vapor is generally assumed. In order to investigate the near-surface layer formed by the ablation of polyoxymethylene, high-speed photography and space-resolved optical emission spectroscopy are used. Transient arc plasmas generated under a 1.9-kA, 50-Hz current semicycle are used as ablation source in air. It is found that the near-surface ablation layer strongly scatters radiation emitted by the arc core. This effect is caused by light scattering of micrometer-size fragments released by the ablating polymer. This finding shows that the near-surface layer is not only composed of vapor but also contains a significant density of large-sized polymer fragments. These fragments are formed a few milliseconds after the ignition of the arc plasma, and their density rapidly decreases with the distance to the surface.

Subject headings

TEKNIK OCH TEKNOLOGIER  -- Elektroteknik och elektronik (hsv//swe)
ENGINEERING AND TECHNOLOGY  -- Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)

Keyword

Arc plasma
optical emission spectroscopy
polymer ablation
scattering
vapor layer

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ref (subject category)
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