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The ReactorSTM :
The ReactorSTM : Atomically resolved scanning tunneling microscopy under high-pressure, high-temperature catalytic reaction conditions
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Herbschleb, C. T. (author)
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Van Der Tuijn, P. C. (author)
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Roobol, S. B. (author)
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Navarro, V. (author)
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Bakker, J. W. (author)
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Liu, Q. (author)
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- Stoltz, David (author)
- KTH,Tillämpad termodynamik och kylteknik
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Cañas-Ventura, M. E. (author)
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Verdoes, G. (author)
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Van Spronsen, M. A. (author)
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Bergman, M. (author)
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Crama, L. (author)
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Taminiau, I. (author)
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Ofitserov, A. (author)
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Van Baarle, G. J. C. (author)
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Frenken, J. W. M. (author)
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(creator_code:org_t)
- AIP Publishing, 2014
- 2014
- English.
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In: Review of Scientific Instruments. - : AIP Publishing. - 0034-6748 .- 1089-7623. ; 85:8
- Related links:
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https://doi.org/10.1...
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https://doi.org/10.1...
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https://urn.kb.se/re...
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https://doi.org/10.1...
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Abstract
Subject headings
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- To enable atomic-scale observations of model catalysts under conditions approaching those used by the chemical industry, we have developed a second generation, high-pressure, high-temperature scanning tunneling microscope (STM): the ReactorSTM. It consists of a compact STM scanner, of which the tip extends into a 0.5 ml reactor flow-cell, that is housed in a ultra-high vacuum (UHV) system. The STM can be operated from UHV to 6 bars and from room temperature up to 600 K. A gas mixing and analysis system optimized for fast response times allows us to directly correlate the surface structure observed by STM with reactivity measurements from a mass spectrometer. The in situ STM experiments can be combined with ex situ UHV sample preparation and analysis techniques, including ion bombardment, thin film deposition, low-energy electron diffraction and x-ray photoelectron spectroscopy. The performance of the instrument is demonstrated by atomically resolved images of Au(111) and atom-row resolution on Pt(110), both under high-pressure and high-temperature conditions.
Subject headings
- NATURVETENSKAP -- Fysik -- Den kondenserade materiens fysik (hsv//swe)
- NATURAL SCIENCES -- Physical Sciences -- Condensed Matter Physics (hsv//eng)
Keyword
- Chemical industry
- Electrons
- Ion bombardment
- Low energy electron diffraction
- Scanning tunneling microscopy
- X ray photoelectron spectroscopy
- Analysis techniques
- Catalytic reactions
- High-pressure and high-temperature
- Reactivity measurements
- Room temperature
- Sample preparation
- Second generation
- Thin-film depositions
- Catalysis
Publication and Content Type
- ref (subject category)
- art (subject category)
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- By the author/editor
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Herbschleb, C. T ...
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Van Der Tuijn, P ...
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Roobol, S. B.
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Navarro, V.
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Bakker, J. W.
-
Liu, Q.
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show more...
-
Stoltz, David
-
Cañas-Ventura, M ...
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Verdoes, G.
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Van Spronsen, M. ...
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Bergman, M.
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Crama, L.
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Taminiau, I.
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Ofitserov, A.
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Van Baarle, G. J ...
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Frenken, J. W. M ...
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show less...
- About the subject
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- NATURAL SCIENCES
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NATURAL SCIENCES
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and Physical Science ...
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and Condensed Matter ...
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Review of Scient ...
- By the university
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Royal Institute of Technology