Search: onr:"swepub:oai:DiVA.org:kth-324458" >
Accurate Condition ...
Accurate Condition Monitoring of Semiconductor Devices in Cascaded H-Bridge Modular Multilevel Converters
-
- Asoodar, Mohsen (author)
- KTH,Elkraftteknik
-
- Nahalparvari, Mehrdad (author)
- KTH,Elkraftteknik
-
- Zhang, Yi (author)
- Aalborg Univ, DK-9220 Aalborg, Denmark.
-
show more...
-
- Danielsson, Christer (author)
- Hitachi Energy, Västerås, Sweden.
-
- Nee, Hans-Peter, 1963- (author)
- KTH,Elkraftteknik
-
- Blaabjerg, Frede (author)
- Aalborg Univ, DK-9220 Aalborg, Denmark.
-
show less...
-
(creator_code:org_t)
- Institute of Electrical and Electronics Engineers (IEEE), 2023
- 2023
- English.
-
In: IEEE transactions on power electronics. - : Institute of Electrical and Electronics Engineers (IEEE). - 0885-8993 .- 1941-0107. ; 38:3, s. 3870-3884
- Related links:
-
https://doi.org/10.1...
-
show more...
-
https://urn.kb.se/re...
-
https://doi.org/10.1...
-
show less...
Abstract
Subject headings
Close
- This article presents an online condition monitoring (CM) scheme for semiconductors used in modular multilevel converters (MMCs) that comprise cascaded H-bridge submodules. The CM algorithm is based on detecting changes in the ON-state resistance of the semiconductors over time. The proposed method is shown to successfully perform a curve tracing of semiconductors in MMCs while the semiconductor junction remains at a temperature that is readily measurable and undergoes minute changes during the measurement process. The ON-state resistance value is estimated from the measured ON-state voltage drop of the semiconductors and the measured arm current. Measuring the ON-state resistance at known temperatures allows for separating temperature-dependent variations of the ON-state resistance from age-dependent variations of this parameter. Suitable methods for reducing the effect of noise on the curve-traced data are proposed, and a recursive least square estimator is used to extract the optimum ON-state resistance from the traced v(CE) - i
Subject headings
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik -- Annan elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering -- Other Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
Keyword
- Temperature measurement
- Semiconductor device measurement
- Electrical resistance measurement
- Automatic voltage control
- Resistance
- Monitoring
- Voltage measurement
- Cascaded H-bridge
- condition monitoring (CM)
- flexible ac transmission systems (FACTS)
- health estimation
- modular multilevel converter (MMC)
- online monitoring
- reliability
- semiconductors
Publication and Content Type
- ref (subject category)
- art (subject category)
Find in a library
To the university's database