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Absorption imaging of ultracold atoms on atom chips

Smith, David A. (author)
Aigner, Simon (author)
Hofferberth, Sebastian (author)
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Gring, Michael (author)
Andersson, Mauritz (author)
KTH,Kvantelektronik och -optik, QEO
Wildermuth, Stefan (author)
Krueger, Peter (author)
Schneider, Stephan (author)
Schumm, Thorsten (author)
Schmiedmayer, Joerg (author)
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 (creator_code:org_t)
2011
2011
English.
In: Optics Express. - 1094-4087. ; 19:9, s. 8471-8485
  • Journal article (peer-reviewed)
Abstract Subject headings
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  • Imaging ultracold atomic gases close to surfaces is an important tool for the detailed analysis of experiments carried out using atom chips. We describe the critical factors that need be considered, especially when the imaging beam is purposely reflected from the surface. In particular we present methods to measure the atom-surface distance, which is a prerequisite for magnetic field imaging and studies of atom surface-interactions.

Subject headings

NATURVETENSKAP  -- Fysik -- Atom- och molekylfysik och optik (hsv//swe)
NATURAL SCIENCES  -- Physical Sciences -- Atom and Molecular Physics and Optics (hsv//eng)

Keyword

Optics
Optik

Publication and Content Type

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