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An Envelope Domain Measurement Test Setup to Acquire Linear Scattering Parameters
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- Zenteno, Efrain, 1983- (author)
- Högskolan i Gävle,Ämnesavdelningen för elektronik
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- Isaksson, Magnus, 1969- (author)
- Högskolan i Gävle,Ämnesavdelningen för elektronik
- Wisell, David (author)
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- Andersen, Olav (author)
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- (creator_code:org_t)
- 2008
- 2008
- English.
- In: 72ND ARFTG MICROWAVE MEASUREMENT SYMPOSIUM. ; , s. 54-57, s. 54-57
- Conference paper (peer-reviewed)
Abstract
Subject headings
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- In this paper, the functionality of a vector network analyzer VNA is implemented using the concept of software defined measurements (SDM) [1], called SDM-VNA. A general measurement set-up based on a vector signal generator (VSG) and a vector signal analyzer (VSA) is used. The set-up allows complete linear characterization using only one receiver. A calibration procedure to remove the systematic errors is applied to the results and compared with a modern VNA, showing good agreement.
Subject headings
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik -- Annan elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering -- Other Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
Keyword
- Electronics
Publication and Content Type
- ref (subject category)
- kon (subject category)
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