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  • Zenteno, Efrain,1983-Högskolan i Gävle,Ämnesavdelningen för elektronik (author)

An Envelope Domain Measurement Test Setup to Acquire Linear Scattering Parameters

  • Article/chapterEnglish2008

Publisher, publication year, extent ...

  • 2008
  • printrdacarrier

Numbers

  • LIBRIS-ID:oai:DiVA.org:kth-45200
  • https://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-45200URI
  • https://doi.org/10.1109/ARFTG.2008.4804287DOI
  • https://urn.kb.se/resolve?urn=urn:nbn:se:hig:diva-3272URI

Supplementary language notes

  • Language:English
  • Summary in:English

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  • Subject category:ref swepub-contenttype
  • Subject category:kon swepub-publicationtype

Notes

  • QC 20111109
  • In this paper, the functionality of a vector network analyzer VNA is implemented using the concept of software defined measurements (SDM) [1], called SDM-VNA. A general measurement set-up based on a vector signal generator (VSG) and a vector signal analyzer (VSA) is used. The set-up allows complete linear characterization using only one receiver. A calibration procedure to remove the systematic errors is applied to the results and compared with a modern VNA, showing good agreement.

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Added entries (persons, corporate bodies, meetings, titles ...)

  • Isaksson, Magnus,1969-Högskolan i Gävle,Ämnesavdelningen för elektronik(Swepub:hig)min (author)
  • Wisell, David (author)
  • Keskitalo, Niclas,1967-Högskolan i Gävle,Ämnesavdelningen för elektronik(Swepub:hig)nko (author)
  • Andersen, Olav (author)
  • Högskolan i GävleÄmnesavdelningen för elektronik (creator_code:org_t)

Related titles

  • In:72ND ARFTG MICROWAVE MEASUREMENT SYMPOSIUM, s. 54-57, s. 54-57
  • In:72nd ARFTG Conf. Dig., Portland, OR, s. 54-57, s. 54-579781424423002

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Zenteno, Efrain, ...
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ENGINEERING AND TECHNOLOGY
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and Electrical Engin ...
ENGINEERING AND TECHNOLOGY
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