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- Zenteno, Efrain,1983-Högskolan i Gävle,Ämnesavdelningen för elektronik (author)
Nonlinear Network Analysis for Modern Communication Devices and Systems
- Article/chapterEnglish2008
Publisher, publication year, extent ...
- IEEE,2008
- printrdacarrier
Numbers
- LIBRIS-ID:oai:DiVA.org:kth-45201
- https://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-45201URI
- https://doi.org/10.1109/ARFTG.2008.4804292DOI
- https://urn.kb.se/resolve?urn=urn:nbn:se:hig:diva-3273URI
Supplementary language notes
- Language:English
- Summary in:English
Part of subdatabase
- SwePubSwePub
Classification
Notes
- QC 20111109
- This paper presents a novel test setup, based on a vector signal generator (VSG) and a vector signal analyzer (VSA), capable of nonlinear characterization of communications devices such as RF power amplifiers. Envelope time-domain waveform extraction and correction is applied to the DUT reference plane, preserving vector correction even in modulated environments where ingoing and outgoing signals from the ports of the DUT can be distinguished. This tool is valuable in the analysis of nonlinear devices, the generation of behavioral models and the study of memory effects..
Subject headings and genre
- TEKNIK OCH TEKNOLOGIER Elektroteknik och elektronik hsv//swe
- ENGINEERING AND TECHNOLOGY Electrical Engineering, Electronic Engineering, Information Engineering hsv//eng
- TEKNIK OCH TEKNOLOGIER Elektroteknik och elektronik Annan elektroteknik och elektronik hsv//swe
- ENGINEERING AND TECHNOLOGY Electrical Engineering, Electronic Engineering, Information Engineering Other Electrical Engineering, Electronic Engineering, Information Engineering hsv//eng
- Electronics
Added entries (persons, corporate bodies, meetings, titles ...)
- Andersen, Olav (author)
- Isaksson, Magnus,1969-Högskolan i Gävle,Ämnesavdelningen för elektronik(Swepub:hig)min (author)
- Keskitalo, Niclas,1967-Högskolan i Gävle,Ämnesavdelningen för elektronik(Swepub:hig)nko (author)
- Wisell, David (author)
- Högskolan i GävleÄmnesavdelningen för elektronik (creator_code:org_t)
Related titles
- In:72ND ARFTG MICROWAVE MEASUREMENT SYMPOSIUM: IEEE, s. 64-68, s. 64-68
- In:72nd ARFTG Conf. Dig., Portland, OR: IEEE, s. 64-68, s. 64-689781424423002
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