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Towards an almost c-testable NoC test strategy
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- Petersén, Kim (author)
- KTH,Elektronik- och datorsystem, ECS
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- Magnhagen, Bengt (author)
- Jönköpings Tekniska Högskola
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- Öberg, Johnny (author)
- KTH,Elektronik- och datorsystem, ECS
- (creator_code:org_t)
- 2007
- 2007
- English.
- In: Proceedings of the IEEE East-West Design and Test Symposium.
- Conference paper (peer-reviewed)
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Subject headings
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik -- Annan elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering -- Other Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
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- Petersén, Kim
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- Öberg, Johnny
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- Royal Institute of Technology
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