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Advances in Nanoscale Resolution Soft X-Ray Laser Microscopy

Menoni, C. S. (author)
Brizuela, F. (author)
Brewer, C. (author)
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Martz, Dale (author)
Colorado State University
Wachulak, P. (author)
Jimenez, Fernandez (author)
Marconi, M. C. (author)
Rocca, J. J. (author)
Chao, W. (author)
Anderson, E. H. (author)
Attwood, D. T. (author)
Vinogradov, A. V. (author)
Artioukov, I. A. (author)
Pershyn, Y. P. (author)
Kondratenko, V. V. (author)
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 (creator_code:org_t)
Springer Netherlands, 2009
2009
English.
In: X-RAY LASERS 2008, PROCEEDINGS. - : Springer Netherlands. - 9781402099236 ; , s. 341-347
  • Conference paper (peer-reviewed)
Abstract Subject headings
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  • We review our most recent results on table-top, nanometer-scale resolution, microscopy using compact soft x-ray lasers developed at Colorado State University. We have realized the first demonstration of wavelength-resolution microscopy in the soft x-ray spectral range. Images of carbon nanotubes, 50 nm in diameter, were obtained with a single similar to 1 ns duration laser pulse from a desk-top size capinary discharge 46.9 nm laser. We fully characterized the new microscope by measuring the modulation transfer function of the instrument for zone plate objectives with three different numerical apertures, demonstrating that 54 nm half-period structures can be resolved. The combination of near-wavelength spatial resolution with high temporal resolution imaging opens myriad opportunities for imaging nanoscale structures.

Subject headings

TEKNIK OCH TEKNOLOGIER  -- Annan teknik (hsv//swe)
ENGINEERING AND TECHNOLOGY  -- Other Engineering and Technologies (hsv//eng)

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