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Optical investigation of 3C-SiC hetero-epitaxial layers grown by sublimation epitaxy under gas atmosphere

Kwasnicki, Pawel (author)
CNRS, L2C UMR 5221, F-34095, Montpellier, France
Jokubavicius, Valdas (author)
Linköpings universitet,Halvledarmaterial,Tekniska högskolan
Sun, Jianwu (author)
Linköpings universitet,Halvledarmaterial,Tekniska högskolan
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Peyre, H. (author)
Université Montpellier 2, L2C UMR 5221, F-34095, Montpellier, France
Yakimova, Rositsa (author)
Linköpings universitet,Halvledarmaterial,Tekniska högskolan
Syväjärvi, Mikael (author)
Linköpings universitet,Halvledarmaterial,Tekniska högskolan
Camasse, J. (author)
CNRS, L2C UMR 5221, F-34095, Montpellier, France
Juillaguet, S. (author)
Université Montpellier 2, L2C UMR 5221, F-34095, Montpellier, France
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 (creator_code:org_t)
Trans Tech Publications Inc. 2014
2014
English.
In: Materials Science Forum. - : Trans Tech Publications Inc.. - 0255-5476 .- 1662-9752. ; 778-780, s. 243-246
  • Journal article (peer-reviewed)
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  • We investigated three 3C-SiC samples grown on 6H SiC substrate by sublimation epitaxy under gas atmosphere. We focus on the low temperature photoluminescence and Raman measurements to show that compare to a growth process under vacuum atmosphere, the gas atmosphere favor the incorporation of impurities at already existing and/or newly created defect sites.

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