Probing surface states of Cu/Ni thin films using x-ray absorption spectroscopy

Karis, O (author): Uppsala universitet,Fysiska institutionen,Uppsala University

Magnuson, Martin (author): Uppsala universitet,Fysiska institutionen,Uppsala University

Wiell, T. (author): Uppsala universitet,Fysiska institutionen,Uppsala University

Wassdahl, N. (author): Uppsala universitet,Fysiska institutionen,Uppsala University

Nilsson, A. (author): Uppsala universitet,Fysiska institutionen,Uppsala University

Martensson, N (author): Uppsala universitet,Fysiska institutionen,Uppsala University

(creator_code:org_t)

2001
2001
English.
In: Physical Review B. Condensed Matter and Materials Physics. - 1098-0121 .- 1550-235X. ; 63:11

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Abstract Subject headings

Surface and interface properties of Cu thin films (1–4 monolayers) deposited on Ni(100) have been extracted by means of x-ray absorption spectroscopy and analyzed in combination with ab initio density-functional calculations. An unoccupied Cu surface state is identified in an x-ray absorption spectra and studied as a function of film thickness. Experimental data is supported by calculations of the layer-resolved density of states and the results from this combined theoretical-experimental effort show that the surface state is almost entirely located on the atomic layer closest to the vacuum. Our results also indicate strong hybridization between unoccupied states at the Cu/Ni interface boundary.

By the author/editor: Karis, O; Magnuson, Martin; Wiell, T.; Weinelt, M.; Wassdahl, N.; Nilsson, A.; show more...; Martensson, N; Holmström, E.; Niklasson, A. M. ...; Eriksson, O; Johansson, Börje; show less...

About the subject

By the university: Linköping University; Royal Institute of Technology; Uppsala University

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