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- Glazyrin, K.DESY, Germany (author)
Sub-micrometer focusing setup for high-pressure crystallography at the Extreme Conditions beamline at PETRA III
- Article/chapterEnglish2022
Publisher, publication year, extent ...
- Chichester, United Kingdom :Wiley-Blackwell,2022
- electronicrdacarrier
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- LIBRIS-ID:oai:DiVA.org:liu-185408
- https://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-185408URI
- https://doi.org/10.1107/S1600577522002582DOI
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- Language:English
- Summary in:English
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- Funding Agencies: Federal Ministry of Education and Research, Germany (BMBF) [05K19WC1]; Deutsche Forschungsgemeinschaft (DFG) [DU 954-11/1, DU 393-9/2, DU 393-13/1]; Swedish Government Strategic Research Area in Materials Science on Functional Materials at Linköping University (Faculty Grant SFO-Mat-LiU) [2009 00971]; Alexander von Humboldt Foundation
- Scientific tasks aimed at decoding and characterizing complex systems and processes at high pressures set new challenges for modern X-ray diffraction instrumentation in terms of X-ray flux, focal spot size and sample positioning. Presented here are new developments at the Extreme Conditions beamline (P02.2, PETRA III, DESY, Germany) that enable considerable improvements in data collection at very high pressures and small scattering volumes. In particular, the focusing of the X-ray beam to the sub-micrometer level is described, and control of the aberrations of the focusing compound refractive lenses is made possible with the implementation of a correcting phase plate. This device provides a significant enhancement of the signal-to-noise ratio by conditioning the beam shape profile at the focal spot. A new sample alignment system with a small sphere of confusion enables single-crystal data collection from grains of micrometer to sub-micrometer dimensions subjected to pressures as high as 200 GPa. The combination of the technical development of the optical path and the sample alignment system contributes to research and gives benefits on various levels, including rapid and accurate diffraction mapping of samples with sub-micrometer resolution at multimegabar pressures.
Subject headings and genre
- NATURVETENSKAP Fysik Acceleratorfysik och instrumentering hsv//swe
- NATURAL SCIENCES Physical Sciences Accelerator Physics and Instrumentation hsv//eng
- high pressure; diamond anvil cells; X-ray diffraction; phase correcting plate; sub-micrometer focusing
Added entries (persons, corporate bodies, meetings, titles ...)
- Khandarkhaeva, S.Univ Bayreuth, Germany; Univ Bayreuth, Germany (author)
- Fedotenko, T.DESY, Germany; Univ Bayreuth, Germany (author)
- Dong, W.DESY, Germany (author)
- Laniel, D.Univ Bayreuth, Germany (author)
- Seiboth, F.DESY, Germany (author)
- Schropp, A.DESY, Germany; DESY, Germany (author)
- Garrevoet, J.DESY, Germany (author)
- Bruckner, D.DESY, Germany; Univ Hamburg, Germany; Ruhr Univ Bochum, Germany (author)
- Falkenberg, G.DESY, Germany (author)
- Kubec, A.Paul Scherrer Inst, Switzerland (author)
- David, C.Paul Scherrer Inst, Switzerland (author)
- Wendt, M.DESY, Germany (author)
- Wenz, S.DESY, Germany (author)
- Dubrovinsky, L.Univ Bayreuth, Germany (author)
- Dubrovinskaia, NataliaLinköpings universitet,Teoretisk Fysik,Tekniska fakulteten,Univ Bayreuth, Germany(Swepub:liu)natdo06 (author)
- Liermann, H. P.DESY, Germany (author)
- DESY, GermanyUniv Bayreuth, Germany; Univ Bayreuth, Germany (creator_code:org_t)
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- In:Journal of Synchrotron RadiationChichester, United Kingdom : Wiley-Blackwell29, s. 654-6630909-04951600-5775
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- Schropp, A.
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