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Combinatorial surfa...
Combinatorial surface-enhanced raman spectroscopy and spectroscopic ellipsometry of silver Island films
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- Oates, Thomas W.H. (författare)
- Linköpings universitet,Tekniska högskolan,Tunnfilmsfysik
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- Sugime, H. (författare)
- University of Tokyo
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- Noda, S. (författare)
- University of Tokyo
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(creator_code:org_t)
- 2009-03-03
- 2009
- Engelska.
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Ingår i: Journal of Physical Chemistry C. - : American Chemical Society (ACS). - 1932-7447 .- 1932-7455. ; 113:12, s. 4820-4828
- Relaterad länk:
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https://urn.kb.se/re...
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https://doi.org/10.1...
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Abstract
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- Utilizing a combinatorial method, we used spectroscopic ellipsometry to determine the dielectric functions of silver island films over a large range of sizes and morphologies from the percolation threshold down to average particle size smaller than 5 nm. We measured films on silicon substrates with 2 and 20 nm oxide layers and compared the surface-enhanced Raman scattering properties of the films. As expected, the films on 20-nm-thick oxide substrates showed increased Raman counts due to reduced damping of the plasmon resonance; however, the optical absorption was greater in the films on 2 nm oxide. The maximum Raman scattering was observed for average particle diameters of 13.6 and 25 nm and interparticle spacings of 3.3 and 4.1 nm for the 2 and 20 nm oxide substrates, respectively. The use of a combinatorial method resulted in significantly reduced uncertainties by avoiding multiple sample preparations and allowed unambiguous identification of optimal film parameters for the different substrates.
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- NATURAL SCIENCES
- NATURVETENSKAP
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