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Core-Level Expansio...
Core-Level Expansion of Compressed Test Patterns
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- Larsson, Anders, 1977- (author)
- Linköpings universitet,Tekniska högskolan,ESLAB - Laboratoriet för inbyggda system
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- Zhang, Xin (author)
- Masters Programme in Computer Science Linköpings Universitet
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- Larsson, Erik, 1966- (author)
- Linköpings universitet,Tekniska högskolan,ESLAB - Laboratoriet för inbyggda system
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- Chakrabarty, Krishnendu (author)
- Dept. of Electrical and Computer Engineering Duke University, USA
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(creator_code:org_t)
- Sapporo, JAPAN : IEEE Computer Society, 2008
- 2008
- English.
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In: Proceedings of the Asian Test Symposium. - Sapporo, JAPAN : IEEE Computer Society. - 9780769533964 ; , s. 277-282
- Related links:
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https://urn.kb.se/re...
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https://doi.org/10.1...
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Abstract
Subject headings
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- The increasing test-data volumes needed for the testing of system-on-chip (SOC) integrated circuits lead to long test-application times and high tester memory requirements. Efficient test planning and test-data compression are therefore needed. We present an analysis to highlight the fact that the impact of a test-data compression technique on test time and compression ratio are method-dependant as well as TAM-width dependant. This implies that for a given set of compression schemes, there is no compression scheme that is the optimal with respect to test time reduction and test-data compression at all TAM widths. We therefore propose a technique where we integrate core wrapper design, test architecture design and test scheduling with test-data compression technique selection for each core in order to minimize the SOC test-application time and the test-data volume. Experimental results for several SOCs crafted from industrial cores demonstrate that the proposed method leads to significant reduction in test-data volume and test time.
Subject headings
- NATURVETENSKAP -- Data- och informationsvetenskap -- Datavetenskap (hsv//swe)
- NATURAL SCIENCES -- Computer and Information Sciences -- Computer Sciences (hsv//eng)
Keyword
- integrated circuits
- system-on-chip
- testing
- test-data compression
- memory requirements
- wrapper design
- test-application time
- Computer science
- Datavetenskap
Publication and Content Type
- ref (subject category)
- kon (subject category)
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