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SOC Test Optimizati...
SOC Test Optimization with Compression-Technique Selection
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- Larsson, Anders, 1977- (author)
- Linköpings universitet,Tekniska högskolan,ESLAB - Laboratoriet för inbyggda system
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- Zhang, Xin (author)
- Masters Programme in Computer Science Linköpings Universitet
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- Larsson, Erik, 1966- (author)
- Linköpings universitet,Tekniska högskolan,ESLAB - Laboratoriet för inbyggda system
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- Chakrabarty, Krishnendu (author)
- Dept. of Electrical and Computer Engineering Duke University, USA
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(creator_code:org_t)
- IEEE, 2008
- 2008
- English.
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In: Proceedings - International Test Conference. - : IEEE. - 9781424424030 - 9781424424023 ; , s. 1-
- Related links:
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https://urn.kb.se/re...
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https://doi.org/10.1...
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Abstract
Subject headings
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- The increasing test-data volumes needed for the testing of system-on-chip (SOC) lead to long test times and high memory requirements. We present an analysis to highlight the fact that the impact of a test-data compression technique on test time and compression ratio are method-dependant as well as TAM-width dependant. Therefore, we propose a technique where compression-technique selection is integrated with core wrapper design, test architecture design, and test scheduling to minimize the SOC test time and the test-data volume.
Subject headings
- NATURVETENSKAP -- Data- och informationsvetenskap -- Datavetenskap (hsv//swe)
- NATURAL SCIENCES -- Computer and Information Sciences -- Computer Sciences (hsv//eng)
Keyword
- systems-on-chip
- testing
- compression
- Computer science
- Datavetenskap
Publication and Content Type
- vet (subject category)
- kon (subject category)
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