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Weak electronic ani...
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Scabarozi, T.H.Department of Materials Engineering, Drexel University, Philadelphia, PA 19104, United States, Department of Physics and Astronomy, Rowan University, Glassboro, NJ 08028, United States
(author)
Weak electronic anisotropy in the layered nanolaminate Ti 2 GeC
- Article/chapterEnglish2008
Publisher, publication year, extent ...
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Elsevier BV,2008
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printrdacarrier
Numbers
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LIBRIS-ID:oai:DiVA.org:liu-45966
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https://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-45966URI
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https://doi.org/10.1016/j.ssc.2008.03.026DOI
Supplementary language notes
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Language:English
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Summary in:English
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Classification
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Subject category:ref swepub-contenttype
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Subject category:art swepub-publicationtype
Notes
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We have investigated the anisotropy in electronic transport of the layered ternary Ti2GeC by comparing the results of measurements on c-axis oriented epitaxial thin-film and polycrystalline bulk samples. The electrical conductivities, Hall coefficients, and magnetoresistances were analyzed within a multi-band framework. An adequate description of the magnetotransport data on the film with the highest mobility required the use of the explicit field-dependent conductivity tensor with three conduction bands. The analysis indicated that n ˜ p, although with n ˜ 3.5 × 1027 m- 3. The ratio of the a- to c-axis conductivities is small and contrary to theoretical predictions. © 2008 Elsevier Ltd. All rights reserved.
Subject headings and genre
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A. MAX phase
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B. Thin films
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D. Anisotropy
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D. Electronic transport
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TECHNOLOGY
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TEKNIKVETENSKAP
Added entries (persons, corporate bodies, meetings, titles ...)
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Eklund, PerLinköpings universitet,Tekniska högskolan,Tunnfilmsfysik(Swepub:liu)perek02
(author)
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Emmerlich, JensLinköpings universitet,Tekniska högskolan,Tunnfilmsfysik(Swepub:liu)jenem14
(author)
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Högberg, HansLinköpings universitet,Tekniska högskolan,Tunnfilmsfysik(Swepub:liu)hanho47
(author)
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Meehan, T.Department of Physics and Astronomy, Rowan University, Glassboro, NJ 08028, United States
(author)
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Finkel, P.Department of Physics and Astronomy, Rowan University, Glassboro, NJ 08028, United States
(author)
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Barsoum, M.W.Department of Materials Engineering, Drexel University, Philadelphia, PA 19104, United States
(author)
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Hettinger, J.D.Department of Physics and Astronomy, Rowan University, Glassboro, NJ 08028, United States
(author)
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Hultman, LarsLinköpings universitet,Tekniska högskolan,Tunnfilmsfysik(Swepub:liu)larhu75
(author)
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Lofland, S.E.Department of Physics and Astronomy, Rowan University, Glassboro, NJ 08028, United States
(author)
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Department of Materials Engineering, Drexel University, Philadelphia, PA 19104, United States, Department of Physics and Astronomy, Rowan University, Glassboro, NJ 08028, United StatesTekniska högskolan
(creator_code:org_t)
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In:Solid State Communications: Elsevier BV146:11-12, s. 498-5010038-10981879-2766
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- By the author/editor
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Scabarozi, T.H.
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Eklund, Per
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Emmerlich, Jens
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Högberg, Hans
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Meehan, T.
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Finkel, P.
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Barsoum, M.W.
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Hettinger, J.D.
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Hultman, Lars
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Lofland, S.E.
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Solid State Comm ...
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Linköping University