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Dissociation of V-Ga-O-N complexes in HVPE GaN by high pressure and high temperature annealing

Tuomisto, F (author)
Hautakangas, S (author)
Makkonen, I (author)
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Ranki, V (author)
Puska, MJ (author)
Saarinen, K (author)
Bockowski, M (author)
Suski, T (author)
Paskova, Tanja (author)
Linköpings universitet,Tekniska högskolan,Institutionen för fysik, kemi och biologi
Monemar, Bo (author)
Linköpings universitet,Tekniska högskolan,Halvledarmaterial
Xu, X (author)
Look, DC (author)
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 (creator_code:org_t)
Wiley, 2006
2006
English.
In: Physica status solidi. B, Basic research. - : Wiley. - 0370-1972 .- 1521-3951. ; 243:7, s. 1436-1440
  • Journal article (peer-reviewed)
Abstract Subject headings
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  • We have used positron annihilation spectroscopy to study the high-pressure annealing induced thermal recovery of vacancy defects in free-standing GaN grown by hydride vapor phase epitaxy (HYPE). The results show that the in-grown Ga vacancy complexes recover after annealing at 1500-1700 K. Comparison of the experimental positron data with ab-initio calculations indicates that the Doppler broadening measurement of the electron momentum distribution is sensitive enough to distinguish between the N and O atoms surrounding the Ga vacancy. We show that the difference between the isolated V-Ga in electron irradiated GaN and the V-Ga-O-N complexes in highly O-doped GaN is clear, and the Ga vacancy related defect complexes that start dissociating at 1500 K can be identified as V-Ga-O-N pairs.

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TECHNOLOGY
TEKNIKVETENSKAP

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