A new type of quantum wells: Stacking faults in silicon carbide

A new type of quantum wells : Stacking faults in silicon carbide

Iwata, H. (author): Department of Physics and Measurement Technology, Linköping University

Lindefelt, Ulf (author): Linköpings universitet,Tekniska högskolan,Institutionen för fysik, kemi och biologi,Department of Physics and Measurement Technology, Linköping University

Öberg, Sven (author): Luleå tekniska universitet,Matematiska vetenskaper,Öberg, S., Department of Mathematics, Luleå University of Technology, SE-97187 Luleå, Sweden

Briddon, P.R. (author): Department of Physics, University of Newcastle upon Tyne, Newcastle NE1 7RU, United Kingdom

(creator_code:org_t)

Related links:: https://urn.kb.se/re...; show more...; https://doi.org/10.1...; https://urn.kb.se/re...; show less...

Abstract Subject headings

We report on a new type of quantum wells with the width as thin as 10Å, which are composed of SiC only, and consequently have ideal interfaces. These quantum wells are actually stacking faults in SiC. Certain types of stacking faults in SiC polytypes create small 3C-like regions, where the stacking sequences along the c-axis become locally cubic in the hexagonal host crystals. Since the conduction band offsets between the cubic and hexagonal polytypes are very large with the conduction band minima of 3C-SiC lower than that of the other polytypes, such thin 3C inclusions can introduce locally lower conduction bands, thus acting as quantum films perpendicular to the c-axis. One mechanism for the occurrence of stacking faults in the perfect SiC single crystals is the motion of partial dislocations in the basal planes, the partial dislocations leaving behind stacking fault regions. © 2003 Elsevier Science Ltd. All rights reserved.

About the subject

NATURAL SCIENCES: NATURAL SCIENCES; and Mathematics; and Computational Ma ...

Kungliga biblioteket hanterar dina personuppgifter i enlighet med EU:s dataskyddsförordning (2018), GDPR. Läs mer om hur det funkar här.
Så här hanterar KB dina uppgifter vid användning av denna tjänst.