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Critical parameters...
Critical parameters for parallel interconnects using VCSEL arrays and fiber image guides
- Article/chapterEnglish2002
Publisher, publication year, extent ...
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SPIE,2002
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printrdacarrier
Numbers
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LIBRIS-ID:oai:DiVA.org:liu-46835
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https://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-46835URI
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https://doi.org/10.1117/12.476230DOI
Supplementary language notes
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Language:English
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Summary in:English
Part of subdatabase
Classification
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Subject category:vet swepub-contenttype
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Subject category:kon swepub-publicationtype
Notes
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Several thousand glass optical fibers fused together is routinely used as fiber image guides for medical and other image remoting applications. Fiber image guides also offer possibility for flexible optical interconnect links with potentially thousands of bi-directional parallel channels with data rates as high as 10 Gbps per channel, leading to more than Tera bits per second aggregate data transfer rates. A fair number of fiber image guide based link demonstrations using vertical cavity surface emitting lasers have been reported. However, little is known about designable parameters and optimization paradigms for applications to massively parallel optical interconnects. This paper discusses critical optical parameters that characterize a massively parallel link. Experimental characterizations were carried out to explore some of the fundamental interactions between single-mode 850 nm VCSELs and fiber image guides having different numerical apertures, 0.25, 0.55 and 1.00. Preliminary optical simulation results are given. Finally, potential directions for further experimental and analytical explorations, and for applicability into designable link systems are suggested.
Subject headings and genre
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Fiber bundles
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Fiber coupling
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Fiber image guides
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Fiber modes
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Multimode fibers
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Optical feedback
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Optical interconnections
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Optics in computing
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Parallel datalink
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Parallel processing
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Photonic production
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VCSELs
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NATURAL SCIENCES
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NATURVETENSKAP
Added entries (persons, corporate bodies, meetings, titles ...)
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Hadley, G.R.Sandia National Laboratories, MS 0603, PO Box 5800, Albuquerque, NM 87185, United States
(author)
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Geib, K.M.Sandia National Laboratories, MS 0603, PO Box 5800, Albuquerque, NM 87185, United States
(author)
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Choquette, K.D.Sandia National Laboratories, MS 0603, PO Box 5800, Albuquerque, NM 87185, United States, Dept of Electrical Engineering, University of Illinois, Urbana, IL 61801, United States
(author)
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Carter, T.R.Sandia National Laboratories, MS 0603, PO Box 5800, Albuquerque, NM 87185, United States
(author)
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Fischer, A.J.Sandia National Laboratories, MS 0603, PO Box 5800, Albuquerque, NM 87185, United States
(author)
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Robinson, M.Schott Optovance, 15 Sandersdale Road, Southbridge, MA 01550, United States
(author)
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Sullivan, C.T.Sandia National Laboratories, MS 0603, PO Box 5800, Albuquerque, NM 87185, United States
(author)
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Sandia National Laboratories, MS 0603, PO Box 5800, Albuquerque, NM 87185, United StatesSandia National Laboratories, MS 0603, PO Box 5800, Albuquerque, NM 87185, United States, Dept of Electrical Engineering, University of Illinois, Urbana, IL 61801, United States
(creator_code:org_t)
Related titles
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In:Proceedings of SPIE, the International Society for Optical Engineering: SPIE4942, s. 292-3050277-786X1996-756X
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