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Chemical bonding in carbon nitride films studied by X-ray spectroscopies

Zheng, W.T. (author)
Department of Materials Science and National Key Laboratory of Superhard Materials, Jilin University, Changchun 130023, China, Department of Precision Engineering, Chiba Institute of Technology, 2-17-1 Tsudanuma, Narashino 275-0016, Japan, Department of Physics, Linkoping University, S-581 83 Linkoping, Sweden, National Key Laboratory of Materials Surface Modification by Laser, Ion, and Electron, Dalian University of Technology, Dalian 116024, China
Guo, J.H. (author)
Department of Physics, Uppsala University, Box 530, 751 21 Uppsala, Sweden
Sakamoto, Y. (author)
Department of Precision Engineering, Chiba Institute of Technology, 2-17-1 Tsudanuma, Narashino 275-0016, Japan
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Takaya, M. (author)
Department of Precision Engineering, Chiba Institute of Technology, 2-17-1 Tsudanuma, Narashino 275-0016, Japan
Li, X.T. (author)
Department of Materials Science and National Key Laboratory of Superhard Materials, Jilin University, Changchun 130023, China
Chao, P.J. (author)
Department of Materials Science and National Key Laboratory of Superhard Materials, Jilin University, Changchun 130023, China
Jin, Z.S. (author)
Department of Materials Science and National Key Laboratory of Superhard Materials, Jilin University, Changchun 130023, China
Xing, K.Z. (author)
Department of Physics, Linkoping University, S-581 83 Linkoping, Sweden
Sundgren, J.-E. (author)
Department of Physics, Linkoping University, S-581 83 Linkoping, Sweden
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 (creator_code:org_t)
2001
2001
English.
In: Diamond and related materials. - 0925-9635 .- 1879-0062. ; 10:9-10, s. 1897-1900
  • Journal article (peer-reviewed)
Abstract Subject headings
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  • Carbon nitride films are deposited using dc magnetron sputtering in a N2 discharge. The nature of chemical bonding of the films is investigated using X-ray photoelectron spectroscopy, near-edge X-ray absorption fine structure, and X-ray emission spectroscopy. X-Ray photoelectron spectroscopy spectra show that N1s binding states depend on substrate temperature, in which two pronounced peaks can be observed. The near edge X-ray absorption fine structure at C1s and N1s exhibits a similar absorption profile in the p* resonance region, but the s* resonance is sharper in the N1s spectra. Resonant N K-emission spectra show a strong dependence on excitation photo energies. Compared XPS N1s spectra with recent theoretical calculations by Johansson and Stafstrom, two main nitrogen sites are assigned in which N bound to sp3 hybridized C and sp2 hybridized C, respectively. The correlation of X-ray photoelectron, X-ray absorption, and X-ray emission spectra for N in carbon nitride films is also discussed. © 2001 Elsevier Science B.V. All rights reserved.

Keyword

Carbon nitride film
Chemical bonding
Magnetron sputtering
X-ray spectroscopies
NATURAL SCIENCES
NATURVETENSKAP

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