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Early stages of oxygen clustering in hydrogenated Cz-Si : IR absorption studies

Murin, L.I. (author)
Institute of Solid State and Semiconductor Physics, P. Brovki Street 17, 220072 Minsk, Belarus
Markevich, V.P. (author)
Institute of Solid State and Semiconductor Physics, P. Brovki Street 17, 220072 Minsk, Belarus
Suezawa, M. (author)
Institute for Materials Research, Tohoku University, Sendai 980-77, Japan
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Lindstrom, J.L. (author)
Lindström, J.L., Department of Physics, University of Lund, S-221 00 Lund, Sweden
Kleverman, M. (author)
Department of Physics, University of Lund, S-221 00 Lund, Sweden
Hallberg, T. (author)
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Institute of Solid State and Semiconductor Physics, P Brovki Street 17, 220072 Minsk, Belarus Institute for Materials Research, Tohoku University, Sendai 980-77, Japan (creator_code:org_t)
2001
2001
English.
In: Physica. B, Condensed matter. - 0921-4526 .- 1873-2135. ; 302-303, s. 180-187
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  • The formation kinetics of small oxygen clusters in hydrogenated Si has been studied by means of infrared absorption measurements. Hydrogen was introduced into the crystals by in-diffusion from H2 gas at 1200-1300°C. The samples were heated at temperatures in the range of 280-370°C for different durations. At initial stages of heat-treatment, enormous generation rates of the oxygen dimer have been observed in hydrogenated samples. This indicates highly enhanced diffusion of the interstitial oxygen atoms. The maximum achievable concentration of the dimers is found to be limited by their dissociation rate even at temperatures of about 300°C, while in as-grown crystals the capture processes are known to be dominant in this temperature region. An explanation of this phenomenon is presented. © 2001 Published by Elsevier Science B.V.

Keyword

Hydrogen
Infrared absorption spectroscopy
Oxygen clustering
Silicon
NATURAL SCIENCES
NATURVETENSKAP

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