Micro-photoluminescence spectroscopy of exciton-polaritons in GaN with the wave vector k normal to the c-axis

• We report on polarized micro-photoluminescence (mu -PL) and micro-reflectance (mu -R) studies of GaN layers grown by HVPE. A strong pi -polarized component in the vicinity of A exciton is observed in the mu -PL and attributed as a mixture of a bound B exciton, dominating at low temperature, and scattered A exciton-polariton states prevailing at higher temperatures. Temperature variation of exciton energies in the mu -R spectra reveals strain-induced difference between the top surface and the cleaved edges.

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