onr:"swepub:oai:DiVA.org:liu-49093"
Search: onr:"swepub:oai:DiVA.org:liu-49093" > Modification of the...
- 1 of 1
- Previous record
- Next record
- To hitlist
Modification of the structure of ZnO : Al films by control of the plasma parameters
-
- Tzolov, M (author)
- Bulgarian Acad Sci, Cent Lab Solar Energy & New Energy Sources, Sofia 1784, Bulgaria Bulgarian Acad Sci, Inst Solid State Phys, Sofia 1784, Bulgaria Univ Roma La Sapienza, I-00161 Rome, Italy INFM, Unita Roma 1, I-00161 Rome, Italy Linkoping Univ, IFM, FYSIKHUSET, S-58183 Linkoping, Sweden
-
- Tzenov, N (author)
- Bulgarian Acad Sci, Cent Lab Solar Energy & New Energy Sources, Sofia 1784, Bulgaria Bulgarian Acad Sci, Inst Solid State Phys, Sofia 1784, Bulgaria Univ Roma La Sapienza, I-00161 Rome, Italy INFM, Unita Roma 1, I-00161 Rome, Italy Linkoping Univ, IFM, FYSIKHUSET, S-58183 Linkoping, Sweden
-
- Dimova-Malinovska, D (author)
- Bulgarian Acad Sci, Cent Lab Solar Energy & New Energy Sources, Sofia 1784, Bulgaria Bulgarian Acad Sci, Inst Solid State Phys, Sofia 1784, Bulgaria Univ Roma La Sapienza, I-00161 Rome, Italy INFM, Unita Roma 1, I-00161 Rome, Italy Linkoping Univ, IFM, FYSIKHUSET, S-58183 Linkoping, Sweden
- show more...
- show less...
- (creator_code:org_t)
- 2001
- 2001
- English.
- In: Thin Solid Films. - 0040-6090 .- 1879-2731. ; 396:1-2, s. 274-279
- Journal article (peer-reviewed)
Abstract
Subject headings
Close
- ZnO:Al films were deposited by RF magnetron sputtering in triode configuration applying an external DC electric field to the substrates. Reflection high-energy electron diffraction measurements characterized the different films as consisting of randomly-oriented zinc blende crystallites or randomly and texture-oriented wurtzite crystallites, as well as of the amorphous phase. The non-resonant Raman spectra are strongly influenced by the presence of a built-in electric field at the grain boundaries and they do not depend on the symmetry of the microcrystallites. The Raman spectra taken at resonant excitation are more sensitive to the presence of the amorphous phase in the films. (C) 2001 Elsevier Science B.V. All rights reserved.
Keyword
- sputtering
- zinc oxide
- Raman scattering
- high energy electron diffraction (RHEED)
- TECHNOLOGY
- TEKNIKVETENSKAP
Publication and Content Type
- ref (subject category)
- art (subject category)
Find in a library
- Thin Solid Films (Search for host publication in LIBRIS)
To the university's database
- 1 of 1
- Previous record
- Next record
- To hitlist
Find more in SwePub
- By the author/editor
- Tzolov, M
- Tzenov, N
- Dimova-Malinovsk ...
- Kalitzova, M
- Pizzuto, C
- Vitali, G
- show more...
- Zollo, G
- Ivanov, Ivan Gue ...
- show less...
- Articles in the publication
- Thin Solid Films
- By the university
- Linköping University
Search outside SwePub
- Extend your search to:
- Google Book Search
- Google Scholar
Kungliga biblioteket hanterar dina personuppgifter i enlighet med EU:s dataskyddsförordning (2018), GDPR. Läs mer om hur det funkar här.
Så här hanterar KB dina uppgifter vid användning av denna tjänst.
- Copyright © LIBRIS - National Library Systems
- LIBRIS.kb.se
