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  • Li, Z-FChinese Academy of Science, Shanghai (author)

Determination of carrier-transfer length from side-wall quantum well to quantum wire by micro-photoluminescence scanning

  • Article/chapterEnglish2003

Publisher, publication year, extent ...

  • Springer Science Business Media,2003
  • printrdacarrier

Numbers

  • LIBRIS-ID:oai:DiVA.org:liu-59189
  • https://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-59189URI
  • https://doi.org/10.1007/s11664-003-0209-9DOI

Supplementary language notes

  • Language:English
  • Summary in:English

Part of subdatabase

Classification

  • Subject category:ref swepub-contenttype
  • Subject category:art swepub-publicationtype

Notes

  • Micro-photoluminescence (mu-PL) line scanning across a single V-groove, GaAs/AlGaAs quantum wire (QWR) has been performed at room temperature, revealing a clear spatial-dependence of the PL. After fitting each PL spectrum by multi-Gaussian line shapes, intensity profiles of each PL component from confined structures have been obtained as functions of the scanning position. The PL quenching of a side-wall quantum well (SQWL) has been recognized in a certain area in the vicinity of the QWR and is interpreted by carrier transfer into the QWR within effective transfer length. By simulating the carrier-transfer process from SQWL to QWR as a convolution of a step function for carrier distribution and a Gaussian function for exciting laser irradiance, the effective transfer length of about 1.8+/-0.3 mum has, therefore, been concluded.

Subject headings and genre

  • V-groove quantum wire; carrier-transfer length; micro-photoluminescence
  • TECHNOLOGY
  • TEKNIKVETENSKAP

Added entries (persons, corporate bodies, meetings, titles ...)

  • Lu, WChinese Academy of Science, Shanghai (author)
  • Liu, X-QChinese Academy of Science, Shanghai (author)
  • Chen, X-SChinese Academy of Science, Shanghai (author)
  • Shen, S CChinese Academy of Science, Shanghai (author)
  • Fu, YChalmers (author)
  • Willander, MagnusChalmers(Swepub:liu)magwi72 (author)
  • Tan, H HAustralian National University, Canberra (author)
  • Jagadish, CAustralian National University, Canberra (author)
  • Chinese Academy of Science, ShanghaiChalmers (creator_code:org_t)

Related titles

  • In:Journal of Electronic Materials: Springer Science Business Media32:8, s. 913-9160361-52351543-186X

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