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One-bit ΣΔ Encoded StimulusGeneration for on-Chip ADC Test

Ahmad, Shakeel, 1977- (author)
Linköpings universitet,Elektroniska komponenter,Tekniska högskolan
Dabrowski, Jerzy, 1952- (author)
Linköpings universitet,Elektroniska komponenter,Tekniska högskolan
 (creator_code:org_t)
Springer, 2010
2010
English.
In: Journal of electronic testing. - : Springer. - 0923-8174 .- 1573-0727.
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TECHNOLOGY
TEKNIKVETENSKAP

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