Search: onr:"swepub:oai:DiVA.org:liu-65816" >
Standard-free compo...
Standard-free composition measurements of Alx In1–xN by low-loss electron energy loss spectroscopy
-
- Palisaitis, Justinas (author)
- Linköpings universitet,Tunnfilmsfysik,Tekniska högskolan
-
- Hsiao, Ching-Lien (author)
- Linköpings universitet,Tunnfilmsfysik,Tekniska högskolan
-
- Junaid, Muhammad (author)
- Linköpings universitet,Institutionen för fysik, kemi och biologi,Tekniska högskolan
-
show more...
-
- Xie, Mengyao (author)
- Linköpings universitet,Halvledarmaterial,Tekniska högskolan
-
- Darakchieva, Vanya (author)
- Linköpings universitet,Halvledarmaterial,Tekniska högskolan
-
- Carlin, Jean-Francois (author)
- Ecole Polytechnique Fédérale de Lausanne
-
- Grandjean, Nicolas (author)
- Ecole Polytechnique Fédérale de Lausanne
-
- Birch, Jens (author)
- Linköpings universitet,Tunnfilmsfysik,Tekniska högskolan
-
- Hultman, Lars (author)
- Linköpings universitet,Tunnfilmsfysik,Tekniska högskolan
-
- Persson, Per O.Å. (author)
- Linköpings universitet,Tunnfilmsfysik,Tekniska högskolan
-
show less...
-
(creator_code:org_t)
- 2010-12-22
- 2011
- English.
-
In: physica status solidi (RRL) – Rapid Research Letters. - : Wiley. - 1862-6270 .- 1862-6254. ; 5:2, s. 50-52
- Related links:
-
https://liu.diva-por... (primary) (Raw object)
-
show more...
-
http://liu.diva-port...
-
https://urn.kb.se/re...
-
https://doi.org/10.1...
-
show less...
Abstract
Subject headings
Close
- We demonstrate a standard-free method to retrieve compositional information in Alx In1–xN thin films by measuring the bulk plasmon energy (Ep), employing electron energy loss spectroscopy (EELS) in a scanning transmission electron microscope (STEM). Two series of samples were grown by magnetron sputter epitaxy (MSE) and metal organic vapor phase epitaxy (MOVPE), which together cover the full com- positional range 0 ≤ x ≤ 1. Complementary compositional measurements were obtained using Rutherford backscattering spectroscopy (RBS) and the lattice parameters were obtained by X-ray diffraction (XRD). It is shown that Ep follows a linear relation with respect to composition and lattice parameter between the alloying elements from AlN to InN allowing for straightforward compositional analysis.
Keyword
- AlInN;low-loss EELS;thin films;compositional analysis
- NATURAL SCIENCES
- NATURVETENSKAP
Publication and Content Type
- ref (subject category)
- art (subject category)
Find in a library
To the university's database
- By the author/editor
-
Palisaitis, Just ...
-
Hsiao, Ching-Lie ...
-
Junaid, Muhammad
-
Xie, Mengyao
-
Darakchieva, Van ...
-
Carlin, Jean-Fra ...
-
show more...
-
Grandjean, Nicol ...
-
Birch, Jens
-
Hultman, Lars
-
Persson, Per O.Å ...
-
show less...
- Articles in the publication
-
physica status s ...
- By the university
-
Linköping University