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Effect of initial substrate conditions on growth of cubic silicon carbide

Vasiliauskas, Remigijus (author)
Linköpings universitet,Halvledarmaterial,Tekniska högskolan
Marinova, M. (author)
Aristotle University Thessaloniki
Syväjärvi, Mikael (author)
Linköpings universitet,Halvledarmaterial,Tekniska högskolan
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Liljedahl, Rickard (author)
Linköpings universitet,Halvledarmaterial,Tekniska högskolan
Zoulis, G. (author)
CNRS
Lorenzzi, J. (author)
UCB Lyon 1
Ferro, G. (author)
UCB Lyon 1
Juillaguet, S. (author)
CNRS
Camassel, J. (author)
CNRS
K. Polychroniadis, E. (author)
Aristotle University Thessaloniki
Yakimova, Rositsa (author)
Linköpings universitet,Halvledarmaterial,Tekniska högskolan
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 (creator_code:org_t)
Elsevier Science B.V., Amsterdam. 2011
2011
English.
In: Journal of Crystal Growth. - : Elsevier Science B.V., Amsterdam.. - 0022-0248 .- 1873-5002. ; 324:1, s. 7-14
  • Journal article (peer-reviewed)
Abstract Subject headings
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  • In order to analyze the epitaxial growth of cubic silicon carbide by sublimation epitaxy on different substrates, four different 6H-SiC substrate preparations were used: (i) as-received, (ii) re-polished, (iii) annealed and covered by silicon layer and (iv) with (1 1 1) 3C-SiC buffer layer. Almost 100% coverage and low twin density was achieved when grown on the buffer layer. The XRD and TEM characterizations show better material quality when the layer is grown directly on 6H-SiC substrates. Background doping evaluated by LTPL is in the range of 10(16) cm(-3) for N and 10(16) cm(-3) for Al in all grown layers.

Keyword

Nucleation; Characterization; Substrates; Vapor phase epitaxy; Cubic silicon carbide
TECHNOLOGY
TEKNIKVETENSKAP

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